DocumentCode
2499282
Title
Theoretical framework for estimating the conductivity map of the retina through finite element analysis
Author
Tahayori, Bahman ; Meffin, Hamish ; Venables, Nicholas A. ; Grayden, David B. ; Burkitt, Anthony N.
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
6721
Lastpage
6724
Abstract
A mathematical framework for estimation of the conductivity map of the retina is presented. The problem is formulated and solved in two-dimensional space considering hypothetical inhomogeneity in the conductivity profile at each layer of the retina in x and y directions. Finite element analysis is used to solve the equation of continuity in steady state to simulate voltage measurements as well as estimate the conductivity map. The results of simulated noisy data for an inhomogeneous retina layer and the fovea, which has a more complicated geometry, are presented. The error study of the estimated conductivity map shows that the error for an inhomogeneous conductivity profile is approximately 2% and the error for calculating the fovea conductivity map is just above 8%. This method can be extended to three-dimensions and can also be used to measure the impedance of different layers of the retina for alternating currents.
Keywords
bioelectric phenomena; electric impedance measurement; eye; finite element analysis; conductivity map; finite element analysis; fovea; impedance measurement; inhomogeneous conductivity profile; mathematical framework; retina; two-dimensional space; voltage measurements; Conductivity; Equations; Geometry; Mathematical model; Nonhomogeneous media; Retina; Voltage measurement; Algorithms; Computer Simulation; Electric Conductivity; Equipment Design; Finite Element Analysis; Fovea Centralis; Humans; Macular Degeneration; Microelectrodes; Models, Theoretical; Normal Distribution; Reproducibility of Results; Retina; Retinitis Pigmentosa; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6091657
Filename
6091657
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