• DocumentCode
    2499341
  • Title

    Control of structure and properties of compound semiconductor interfaces by Si interface control layer

  • Author

    Hasegawa, H. ; Kodama, S. ; Koyanagi, K. ; Akazawa, M.

  • Author_Institution
    Dept. of Electr. Eng., Hokkaido Univ., Sapporo, Japan
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    289
  • Lastpage
    292
  • Abstract
    The authors review the current status of recent attempts to control the structure and properties of compound semiconductor interfaces by an ultrathin Si interface control layer. Surface and interface states in the energy gap cause many unwanted effects including the so-called Fermi level pinning phenomenon, which is discussed. Control of insulator-semiconductor, metal-semiconductor, and semiconductor-semiconductor interfaces are considered
  • Keywords
    Fermi level; elemental semiconductors; energy gap; interface states; interface structure; semiconductor heterojunctions; semiconductor-insulator boundaries; semiconductor-metal boundaries; silicon; Fermi level pinning; Si interface control layer; compound semiconductor interfaces; energy gap; properties; structure; Fabrication; Gallium arsenide; Indium gallium arsenide; Insulation; Interface states; Oxidation; Passivation; Semiconductor nanostructures; Signal processing; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380653
  • Filename
    380653