DocumentCode
2499341
Title
Control of structure and properties of compound semiconductor interfaces by Si interface control layer
Author
Hasegawa, H. ; Kodama, S. ; Koyanagi, K. ; Akazawa, M.
Author_Institution
Dept. of Electr. Eng., Hokkaido Univ., Sapporo, Japan
fYear
1993
fDate
19-22 Apr 1993
Firstpage
289
Lastpage
292
Abstract
The authors review the current status of recent attempts to control the structure and properties of compound semiconductor interfaces by an ultrathin Si interface control layer. Surface and interface states in the energy gap cause many unwanted effects including the so-called Fermi level pinning phenomenon, which is discussed. Control of insulator-semiconductor, metal-semiconductor, and semiconductor-semiconductor interfaces are considered
Keywords
Fermi level; elemental semiconductors; energy gap; interface states; interface structure; semiconductor heterojunctions; semiconductor-insulator boundaries; semiconductor-metal boundaries; silicon; Fermi level pinning; Si interface control layer; compound semiconductor interfaces; energy gap; properties; structure; Fabrication; Gallium arsenide; Indium gallium arsenide; Insulation; Interface states; Oxidation; Passivation; Semiconductor nanostructures; Signal processing; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location
Paris
Print_ISBN
0-7803-0993-6
Type
conf
DOI
10.1109/ICIPRM.1993.380653
Filename
380653
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