• DocumentCode
    2499633
  • Title

    CMOS time-to-digital converter with low PVT sensitivity 20.8ps resolution and −0.25∼0.22 LSB inaccuracy

  • Author

    Chen, Poki ; Wang, Kai-Ming ; Li, Chuan-Yuan ; Chen, Po-Yu ; Lai, Juan-Shan ; Liu, Cheng-Wei

  • Author_Institution
    Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • fYear
    2011
  • fDate
    24-26 June 2011
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    A simple but accuracy-enhanced CMOS time-to-digital converter (TDC) based on pulse stretcher interpolators is presented. Without the need of modifying the conventional circuit, both inaccuracy and PVT (process, voltage and temperature) sensitivity are substantially reduced. The errors caused by charge injection and clock feedthrough are eliminated by precise device sizing. The accuracy of current and capacitor ratios for its pulse stretchers is ensured by two-dimensional common centroid layouts. Fabricated in a TSMC 0.35 μm standard CMOS process, the time resolution can be realized as 20.8 ps and the INL error is proven to be -0.25~0.22 LSB for 0~20 ns input range. Moreover, the measured resolution merely spreads over 20.25~20.96 ps for twenty packaged chips. All fabricated chips were tested to be full functional under - 40~120°C temperature operation range and 2.6~4.9 V supply voltage range with about ten-fold improvement in temperature drift and supply voltage sensitivity from its predecessor´s.
  • Keywords
    CMOS digital integrated circuits; charge injection; data conversion; accuracy-enhanced CMOS time-to-digital converter; capacitor ratios; charge injection; clock feedthrough; process-voltage-temperature sensitivity; pulse stretcher interpolators; size 0.35 mum; supply voltage range; two-dimensional common centroid layouts; Accuracy; CMOS integrated circuits; Capacitors; Clocks; Layout; Sensitivity; Temperature measurement; PVT sensitivity; Time-to-digital converter; charge injection; clock feedthrough; device sizing; dual-slop; pulse stretcher;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Anti-Counterfeiting, Security and Identification (ASID), 2011 IEEE International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    Pending
  • Print_ISBN
    978-1-61284-631-6
  • Type

    conf

  • DOI
    10.1109/ASID.2011.5967432
  • Filename
    5967432