Title : 
Properties of heteroepitaxial InP solar cells at variable proton energies
         
        
            Author : 
Weinberg, I. ; Swartz, C.K. ; Curtis, H.B. ; Brinker, D.J. ; Vargas-Aburto, C.
         
        
            Author_Institution : 
NASA Lewis Res. Center, Cleveland, OH, USA
         
        
        
        
        
        
            Abstract : 
InP solar cells, epitaxially grown on GaAs substrates with intervening GaxIn1-xAs layers, were irradiated by protons over a range of energies from 10 to 0.5 MeV. Cell performance, temperature dependencies and carrier removal were determined over this energy range. The superior radiation resistance of these cells was due to an excessively small pre-irradiation diffusion length, attributable to a high dislocation density. This latter factor was also found to be dominant in the temperature dependency of open circuit voltage. Carrier removal was found to be inversely proportional to energy while radiation resistance decreased with decreasing proton energy, the proton range being the dominant factor in determining the behavior of these cell properties
         
        
            Keywords : 
III-V semiconductors; carrier lifetime; gallium arsenide; indium compounds; proton effects; semiconductor heterojunctions; solar cells; GaAs substrates; carrier removal; cell properties; heteroepitaxial InP solar cells; high dislocation density; performance; radiation resistance; semiconductor; small pre-irradiation diffusion length; temperature dependencies; variable proton energies; Circuits; Electrical resistance measurement; Gallium arsenide; Indium phosphide; NASA; Photovoltaic cells; Protons; Substrates; Temperature dependence; Voltage;
         
        
        
        
            Conference_Titel : 
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
         
        
            Conference_Location : 
Paris
         
        
            Print_ISBN : 
0-7803-0993-6
         
        
        
            DOI : 
10.1109/ICIPRM.1993.380670