Title :
Proton conductivity measurement of the sol-gel derived yttrium-doped SrZrO3 thin films for fuel cell applications
Author :
Uchiyama, Kiyoshi ; Isse, Yuri ; Takashi, Takeda ; Nishida, N. ; Uraoka, Yukiharu
Author_Institution :
Dept. of Electr. & Electron., Tsuruoka Nat. Coll. of Technol., Yamagata, Japan
Abstract :
Crystallized yttrium-doped SrZrO3 thin films were successfully deposited by sol-gel method with annealing temperatures above 600 °C. The conductivity of the derived films was larger than 10-6 S/cm at 600 °C. In the temperature ranges of 350-400 °C, the ratio of the conductivities in the H2O and D2O atmospheres was about 1.4, which suggests the film was proton conductive. In turn, at higher temperatures, the ratio of the conductivities decreased, which means another conductive element, might be oxygen ions, becomes dominant. Though further improvement in conductivity is necessary, we consider this film would bring the lower temperature operations of the SOFCs because it showed proton conductivity below 450 °C.
Keywords :
annealing; crystallisation; ionic conductivity; sol-gel processing; strontium compounds; thin films; yttrium; SOFC; SrZrO3:Y; annealing temperature; conductive element; crystallized thin films; fuel cell application; proton conductivity; sol-gel derived thin films; temperature 350 degC to 400 degC; temperature 600 degC; Annealing;
Conference_Titel :
Applications of Ferroelectrics (ISAF), 2010 IEEE International Symposium on the
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-8190-3
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2010.5712243