• DocumentCode
    2499858
  • Title

    Annealed SMC Samplers for Dirichlet Process Mixture Models

  • Author

    Ulker, Yener ; Gunsel, Bilge ; Cemgil, Ali Taylan

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Istanbul, Turkey
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    2808
  • Lastpage
    2811
  • Abstract
    In this work we propose a novel algorithm that approximates sequentially the Dirichlet Process Mixtures (DPM) model posterior. The proposed method takes advantage of the Sequential Monte Carlo (SMC) samplers framework to design an effective annealing procedure that prevents the algorithm to get trapped in a local mode. We evaluate the performance in a Bayesian density estimation problem with unknown number of components. The simulation results suggest that the proposed algorithm represents the target posterior much more accurately and provides significantly smaller Monte Carlo error when compared to particle filtering.
  • Keywords
    Bayes methods; Monte Carlo methods; simulated annealing; Bayesian density estimation problem; Dirichlet process mixture models; annealed SMC samplers; annealing procedure; sequential Monte Carlo samplers; Algorithm design and analysis; Annealing; Approximation methods; Inference algorithms; Kernel; Markov processes; Monte Carlo methods; Bayesian nonparametrics; Dirichlet process mixture; sequential Monte Carlo;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.688
  • Filename
    5597024