Title :
Annealed SMC Samplers for Dirichlet Process Mixture Models
Author :
Ulker, Yener ; Gunsel, Bilge ; Cemgil, Ali Taylan
Author_Institution :
Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Istanbul, Turkey
Abstract :
In this work we propose a novel algorithm that approximates sequentially the Dirichlet Process Mixtures (DPM) model posterior. The proposed method takes advantage of the Sequential Monte Carlo (SMC) samplers framework to design an effective annealing procedure that prevents the algorithm to get trapped in a local mode. We evaluate the performance in a Bayesian density estimation problem with unknown number of components. The simulation results suggest that the proposed algorithm represents the target posterior much more accurately and provides significantly smaller Monte Carlo error when compared to particle filtering.
Keywords :
Bayes methods; Monte Carlo methods; simulated annealing; Bayesian density estimation problem; Dirichlet process mixture models; annealed SMC samplers; annealing procedure; sequential Monte Carlo samplers; Algorithm design and analysis; Annealing; Approximation methods; Inference algorithms; Kernel; Markov processes; Monte Carlo methods; Bayesian nonparametrics; Dirichlet process mixture; sequential Monte Carlo;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.688