DocumentCode
2499858
Title
Annealed SMC Samplers for Dirichlet Process Mixture Models
Author
Ulker, Yener ; Gunsel, Bilge ; Cemgil, Ali Taylan
Author_Institution
Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Istanbul, Turkey
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
2808
Lastpage
2811
Abstract
In this work we propose a novel algorithm that approximates sequentially the Dirichlet Process Mixtures (DPM) model posterior. The proposed method takes advantage of the Sequential Monte Carlo (SMC) samplers framework to design an effective annealing procedure that prevents the algorithm to get trapped in a local mode. We evaluate the performance in a Bayesian density estimation problem with unknown number of components. The simulation results suggest that the proposed algorithm represents the target posterior much more accurately and provides significantly smaller Monte Carlo error when compared to particle filtering.
Keywords
Bayes methods; Monte Carlo methods; simulated annealing; Bayesian density estimation problem; Dirichlet process mixture models; annealed SMC samplers; annealing procedure; sequential Monte Carlo samplers; Algorithm design and analysis; Annealing; Approximation methods; Inference algorithms; Kernel; Markov processes; Monte Carlo methods; Bayesian nonparametrics; Dirichlet process mixture; sequential Monte Carlo;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.688
Filename
5597024
Link To Document