Title :
Dielectric properties of (Ba0.8−xBi0.2)(Zn0.1Ti0.9)O3 ceramics for high temperature applications
Author :
Raengthon, Natthaphon ; Cann, David P.
Author_Institution :
Mater. Sci. Program, Oregon State Univ., Corvallis, OR, USA
Abstract :
A number of Pb-free BaTiO3 - Bi(Zn1/2Ti1/2)O3 solid solutions have been studied by Huang et al.. Compositions close to 0.8BaTiO3 - 0.2Bi(Zn1/2Ti1/2)O3 revealed pseudo-cubic symmetry and showed a linear dielectric response. The existence of a nearly flat temperature dependence of the relative permittivity over the temperature range of 100°C to 350°C was also obtained. In this study, the effects of cation non-stoichiometry and doping were investigated in an attempt to optimize the insulation resistance for high temperature capacitor applications. The dielectric response of (Ba0.8-xBi0.2)(Zn0.1Ti0.9)O3 ceramics where 0 ≤ x ≤ 0.08 as well as ZrO2- and Mn2O3-doped ceramics were investigated. The optimum compositions exhibited a relative permittivity in excess of 1150 and low loss tangent (tan δ <; 0.05) that persisted up to a temperature of 460°C. The temperature dependence of resistivity also revealed the improved insulation resistance of Ba-deficient compositions. Additionally, an ionic conduction mechanism was suggested to be responsible for the resistivity at high temperatures.
Keywords :
barium compounds; bismuth compounds; dielectric losses; electrical resistivity; ferroelectric ceramics; ionic conductivity; permittivity; relaxor ferroelectrics; (Ba0.8-xBi0.2)(Zn0.1Ti0.9)O3; cation nonstoichiometry; ceramics; doping; insulation resistance; ionic conduction mechanism; loss tangent; permittivity; pseudo-cubic symmetry; resistivity; solid solutions; temperature 100 degC to 350 degC; Ceramics; Dielectric constant; Resistance; Temperature; Temperature measurement; BaTiO3; component; dielectric; high temperature capacitor; insulation resistance;
Conference_Titel :
Applications of Ferroelectrics (ISAF), 2010 IEEE International Symposium on the
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-8190-3
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2010.5712251