Title :
Spectral Invariant Representation for Spectral Reflectance Image
Author :
Ibrahim, Abdelhameed ; Tominaga, Shoji ; Horiuchi, Takahiko
Author_Institution :
Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
Abstract :
Although spectral images contain large amount of information, compared with color images, the image acquisition is affected by several factors such as shading and specular highlight. Many researchers have introduced color invariant and spectral invariant representations for these factors using the standard dichromatic reflection model of inhomogeneous dielectric materials. However, these representations are inadequate for other materials like metal. This paper proposes a more general spectral invariant representation for obtaining reliable spectral reflectance images. Our invariant representation is derived from the standard dichromatic reflection model for dielectric materials and the extended dichromatic reflection model for metals. We proof the invariant formulas for spectral images of most natural objects preserve spectral information and are invariant to highlights, shading, surface geometry, and illumination intensity. The method is applied to the problem of material classification and image segmentation of a raw circuit board. Experiments are done with real spectral images to examine the performance of the proposed method.
Keywords :
dielectric materials; image classification; image colour analysis; image representation; image segmentation; color images; color invariant representation; extended dichromatic reflection model; highlights; illumination intensity; image acquisition; image segmentation; inhomogeneous dielectric materials; material classification; raw circuit board; reliable spectral reflectance images; shading; spectral invariant representation; standard dichromatic reflection model; surface geometry; Dielectrics; Geometry; Image segmentation; Light sources; Materials; Metals; Printed circuits;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.680