• DocumentCode
    2500367
  • Title

    Study of the time evolution of partial discharge characteristics and interfacial phenomena of simulated XLPE cable joint

  • Author

    Yoshida, Hiroshi ; Tian, Zhihai ; Hikita, Masayuki ; Miyata, Hiroyuki

  • Author_Institution
    Dept. of Electr. Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
  • fYear
    1998
  • fDate
    27-30 Sep 1998
  • Firstpage
    501
  • Lastpage
    504
  • Abstract
    In this paper, time evolution of PD patterns and phase-dependence of waveforms of PD current pulses were measured by a computer system and a phase-angle gate control technique respectively, when the artificial defects were separately placed at the EPR/XLPE interfaces with or without silicone oil. As a result, PD patterns and current pulse-waveforms obviously differed depending on the types of defects and aging duration. Moreover, rise time tr of PD current pulses varied slightly with aging time for each kind of defect. The variations of these PD characteristics have clearly indicated the transition of PD mechanisms and treeing due to the progressive degradation of XLPE insulation. An attempt was also made to interpret the results and interfacial effects of the simulated XLPE cable joint
  • Keywords
    XLPE insulation; ageing; insulation testing; partial discharge measurement; power cable insulation; power cable testing; trees (electrical); aging; current pulse-waveforms; defects; insulation degradation; interfacial phenomena; partial discharge; phase-angle gate control technique; rise time; silicone oil; simulated XLPE cable joint; treeing; Aging; Computer interfaces; Control systems; Current measurement; Paramagnetic resonance; Partial discharge measurement; Partial discharges; Phase measurement; Pulse measurements; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
  • Conference_Location
    Toyohashi
  • Print_ISBN
    4-88686-050-8
  • Type

    conf

  • DOI
    10.1109/ISEIM.1998.741791
  • Filename
    741791