DocumentCode :
2500421
Title :
Simulation of MM-radiowave scattering over statistically uneven surfaces
Author :
Shorokhova, Ye A. ; Illarionov, I.A. ; Klyanchin, A.N.
Author_Institution :
Sedakov Res. Inst. of Meas. Syst., Nizhny Novgorod, Russia
fYear :
2004
fDate :
13-17 Sept. 2004
Firstpage :
779
Lastpage :
780
Abstract :
The work presents the results of numerically simulating the problem of EM MM-wave scattering over statistically uneven surfaces of natural and anthropogenic origin with regard to directional pattern. Calculations have been made using the perturbation technique and the tangential planes technique. The influence of wavelength, elevation of radiation source above the Earth´s surface, angle of sight, electrophysical and statistical surface properties on scattered fields has been studied. The available mathematical and software tools allow for the scattered field and the absolute cross-section to be calculated for varied geometrical and electrophysical parameters of the problem. These investigations have been carried out with the aim of simulating a MM-wave radar radio channel. We intend to develop the model to encompass compound pulse probing signals and actual directional patterns.
Keywords :
computational electromagnetics; electromagnetic wave scattering; millimetre wave propagation; perturbation techniques; radar theory; MM-radiowave scattering; MM-wave radar; compound pulse probing signals; directional pattern; directional patterns; mathematical tools; perturbation technique; software tools; statistically uneven surfaces; surface properties; tangential planes technique; Earth; Helium; Mie scattering; Numerical simulation; Perturbation methods; Radar cross section; Radar scattering; Scattering parameters; Software tools; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2004. CriMico 2004. 2004 14th International Crimean Conference on
Print_ISBN :
966-7968-69-3
Type :
conf
DOI :
10.1109/CRMICO.2004.183443
Filename :
1390425
Link To Document :
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