DocumentCode :
2500717
Title :
How to Control Acceptance Threshold for Biometric Signatures with Different Confidence Values?
Author :
Makihara, Yasushi ; Hossain, Md Altab ; Yagi, Yasushi
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
1208
Lastpage :
1211
Abstract :
In the biometric verification, authentication is given when a distance of biometric signatures between enrollment and test phases is less than an acceptance threshold, and the performance is usually evaluated by a so-called Receiver Operating Characteristics (ROC) curve expressing a trade off between False Rejection Rate (FRR) and False Acceptance Rate (FAR). On the other hand, it is also well known that the performance is significantly affected by the situation differences between enrollment and test phases. This paper describes a method to adaptively control an acceptance threshold with quality measures derived from situation differences so as to optimize the ROC curve. We show that the optimal evolution of the adaptive threshold in the domain of the distance and quality measure is equivalent to a constant evolution in the domain of the error gradient defined as a ratio of a total error rate to a total acceptance rate. An experiment with simulation data demonstrates that the proposed method outperforms the previous methods, particularly under a lower FAR or FRR tolerance condition.
Keywords :
adaptive control; curve fitting; digital signatures; optimisation; acceptance threshold control; biometric signature; biometric verification; confidence value; error gradient; false acceptance rate; optimal evolution; receiver operating characteristics curve; rejection rate; total acceptance rate; total error rate; Adaptation model; Area measurement; Authentication; Error analysis; Estimation; Measurement uncertainty; Training; ROC curve; acceptance threshold control; biometrics; quality measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.301
Filename :
5597068
Link To Document :
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