DocumentCode :
2500722
Title :
Thermal Analysis of AT & SC-Cut Quartz Crystal Resonators Automated Measurement Method and Results
Author :
Förster, Hans-Joschim
fYear :
1982
fDate :
2-4 June 1982
Firstpage :
140
Lastpage :
158
Keywords :
CMOS technology; Capacitance; Circuits; Frequency measurement; Hysteresis; Measurement standards; Oscillators; System testing; Temperature; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
36th Annual Symposium on Frequency Control. 1982
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1982.200563
Filename :
1537503
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2500722
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