• DocumentCode
    2500764
  • Title

    Temperature and voltage dependence of attenuated total reflection properties of liquid crystal molecules on the LB films

  • Author

    Baba, A. ; Kaneko, E. ; Shinbo, K. ; Wakamatsu, T. ; Kato, K. ; Kobayashi, S.

  • Author_Institution
    Graduate Sch. of Sci. & Technol., Niigata Univ., Japan
  • fYear
    1998
  • fDate
    27-30 Sep 1998
  • Firstpage
    591
  • Lastpage
    594
  • Abstract
    Behaviors of liquid crystal molecules, 5CB, have been investigated in the thick cells having aligning layers of the polyimide (PI) Langmuir-Blodgett (LB) films on the aluminum electrodes using the attenuated total reflection (ATR) measurement method. The ATR curves strongly depended upon the AC voltages applied to the cell and upon temperatures. The resonant excitations of the surface plasmon polariton (SPP) were observed in the broad region of the incident angle in the ATR measurements. The tilt angles of the liquid crystal molecules were calculated by fitting the theoretical ATR curves to the experimental ones. The results showed that the ATR measurement method was very useful for evaluating the behaviors of liquid crystal molecules in thick cells
  • Keywords
    Langmuir-Blodgett films; attenuated total reflection; nematic liquid crystals; organic compounds; polaritons; surface plasmons; 5CB; ATR measurement; aligning layer; aluminum electrode; attenuated total reflection; liquid crystal molecules; polyimide Langmuir-Blodgett film; resonant excitation; surface plasmon polariton; temperature dependence; thick cell; tilt angle; voltage dependence; Aluminum; Attenuation measurement; Electrodes; Liquid crystals; Optical films; Polyimides; Reflection; Temperature dependence; Thickness measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
  • Conference_Location
    Toyohashi
  • Print_ISBN
    4-88686-050-8
  • Type

    conf

  • DOI
    10.1109/ISEIM.1998.741812
  • Filename
    741812