DocumentCode
2500767
Title
Extensive testing of floating point unit
Author
Sosnowski, Janusz ; Bech, Tomasz
Author_Institution
Inst. of Control Sci., Warsaw Univ. of Technol., Poland
Volume
1
fYear
2000
fDate
2000
Firstpage
180
Abstract
This paper addresses the problem of developing test programs for IEEE-754 and Intel x87-compliant floating point units (FPUs). Exhaustive testing is assured by a balanced mixture of pseudorandom, fault and application-oriented instruction sequences. Special tools have been used to manage the test monitoring and to optimize the fault coverage. Their usefulness was illustrated with experimental results. Some data related to the cost (in time and RAM space) of the developed tests are presented
Keywords
floating point arithmetic; integrated circuit testing; microprocessor chips; monitoring; sequences; IEEE-754 compliant floating point units; Intel x87-compliant floating point units; RAM space; application-oriented instruction sequences; cost; exhaustive testing; fault coverage optimization; fault sequences; microprocessor testing; pseudorandom sequences; test monitoring; test program development; time; Arithmetic; Circuit faults; Circuit testing; Costs; Hardware; Microprocessors; Monitoring; Observability; Registers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Euromicro Conference, 2000. Proceedings of the 26th
Conference_Location
Maastricht
ISSN
1089-6503
Print_ISBN
0-7695-0780-8
Type
conf
DOI
10.1109/EURMIC.2000.874631
Filename
874631
Link To Document