DocumentCode :
250095
Title :
Statistical analyses of galaxy-surveys to probe the standard cosmological model
Author :
Vielva, Patricio
Author_Institution :
Insituto de Fis. de Cantabria, Univ. de Cantabria, Santander, Spain
fYear :
2014
fDate :
27-30 Oct. 2014
Firstpage :
6016
Lastpage :
6020
Abstract :
The recent success of the Planck mission has consolidated the ΛCDM cosmological model as the standard paradigm for describing the origin, evolution and fate of the Universe. However, there are still relevant questions to be answered: which is the specific mechanism responsible of the cosmic inflation? which particle or particles are responsible for the dark matter? is the current accelerated expansion of the universe caused by a vacuum energy or a dynamic fluid? Many of these questions will be explored by the future generation of galaxy surveys, which will map the large-scale structure of the Universe. However, before that, interesting insights can be obtained from current data sets. The aim of this work is to stress the importance of some image processing and statistical approaches on this field, including multi-resolution, Bayesian inference and image filtering. It reviews some recent contributions to determine the galaxy redshift distribution, to constrain primordial non-Gaussianity, or to explore anisotropic models of the Universe, among others.
Keywords :
cosmic acceleration; cosmology; dark matter; galaxies; gravitation; gravitational red shift; statistical analysis; Bayesian inference; Lambda cold dark matter cosmological model; Planck mission; Universe; accelerated expansion; anisotropic model; cosmic inflation; dynamic fluid; galaxy redshift distribution; galaxy-survey; image filtering; primordial nonGaussianity; standard cosmological model; statistical analysis; vacuum energy; Anisotropic magnetoresistance; Collaboration; Dark energy; Modulation; Probes; System-on-chip; Observational cosmology; data analysis; large-scale structure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/ICIP.2014.7026214
Filename :
7026214
Link To Document :
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