Radiation Hardness of CCD Vertex Detectors for the ILC

Author

Sopczak, Andre ; Bekhouche, Khaled ; Bowdery, Chris ; Damerell, Chris ; Davies, Gavin ; Dehimi, Lakhdar ; Greenshaw, Tim ; Koziel, Michal ; Stefanov, Konstantin ; Woolliscroft, Tim ; Worm, Steve

Author_Institution

Lancaster Univ.

Volume

1

fYear

2006

fDate

Oct. 29 2006-Nov. 1 2006

Firstpage

576

Lastpage

582

Abstract

Results of detailed simulations of the charge transfer inefficiency of a prototype CCD chip are reported. The effect of radiation damage in a particle detector operating at a future accelerator is studied by examining two electron trap levels, 0.17 eV and 0.44 eV below the bottom of the conduction band. Good agreement is found between simulations using the ISE-TCAD DESSIS program and an analytical model for the 0.17 eV level. Optimum operation is predicted to be at about 250 K where the effects of the traps is minimal which is approximately independent of readout frequency. This work has been carried out within the Linear Collider Flavour Identification (LCFI) collaboration in the context of the International Linear Collider (ILC) project.

Keywords

charge-coupled devices; electron beam effects; electron traps; position sensitive particle detectors; semiconductor counters; semiconductor doping; CCD chip; CCD vertex detectors; ILC; ISE-TCAD DESSIS program; International Linear Collider; LCFI; Linear Collider Flavour Identification; charge transfer inefficiency; conduction band; electron trap levels; particle detector radiation damage; radiation hardness; Analytical models; Charge coupled devices; Charge transfer; Collaborative work; Electron accelerators; Electron traps; Frequency; Particle accelerators; Radiation detectors; Virtual prototyping;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2006. IEEE

Conference_Location

San Diego, CA

ISSN

1095-7863

Print_ISBN

1-4244-0560-2

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2006.356222

Filename

4179061