DocumentCode :
2501672
Title :
Statistical characterization of multiconductor transmission lines illuminated by a random plane-wave field
Author :
Pignari, Sergio ; Bellan, Diego
Author_Institution :
Dipt. di Elettrotecnica, Politecnico di Milano, Italy
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
605
Abstract :
This work addresses the problem of field coupling to multiconductor transmission lines (MTLs) by means of a statistical approach. Currents induced in the MTL loads are regarded as random variables, depending on random amplitude, polarization, and direction of incidence of an offending plane wave. The aim is to identify some statistical properties of the current magnitude in the line loads. Influences of the MTL geometrical parameters and load configurations on the statistical properties of the currents induced in different MTL wires are investigated. In particular, a bundle- and a bus-like configuration are analyzed and compared from the point of view of external susceptibility. For low frequencies, the consistency of statistical estimates is supported by analytical considerations
Keywords :
electric current; electromagnetic compatibility; electromagnetic fields; electromagnetic induction; electromagnetic wave polarisation; electromagnetic wave propagation; multiconductor transmission lines; random processes; statistical analysis; EMC; LF statistical estimates; MTL loads; bundle-like configuration; bus-like configuration; current magnitude; electromagnetic compatibility; external susceptibility; field coupling; geometrical parameters; induced currents; line loads; load configurations; low frequencies; multiconductor transmission lines; plane wave incidence direction; polarization; random amplitude; random plane-wave field; random variables; statistical characterization; statistical properties; Couplings; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic modeling; Frequency estimation; Multiconductor transmission lines; Polarization; Random variables; Transmission lines; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
Type :
conf
DOI :
10.1109/ISEMC.2000.874689
Filename :
874689
Link To Document :
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