DocumentCode
2501672
Title
Statistical characterization of multiconductor transmission lines illuminated by a random plane-wave field
Author
Pignari, Sergio ; Bellan, Diego
Author_Institution
Dipt. di Elettrotecnica, Politecnico di Milano, Italy
Volume
2
fYear
2000
fDate
2000
Firstpage
605
Abstract
This work addresses the problem of field coupling to multiconductor transmission lines (MTLs) by means of a statistical approach. Currents induced in the MTL loads are regarded as random variables, depending on random amplitude, polarization, and direction of incidence of an offending plane wave. The aim is to identify some statistical properties of the current magnitude in the line loads. Influences of the MTL geometrical parameters and load configurations on the statistical properties of the currents induced in different MTL wires are investigated. In particular, a bundle- and a bus-like configuration are analyzed and compared from the point of view of external susceptibility. For low frequencies, the consistency of statistical estimates is supported by analytical considerations
Keywords
electric current; electromagnetic compatibility; electromagnetic fields; electromagnetic induction; electromagnetic wave polarisation; electromagnetic wave propagation; multiconductor transmission lines; random processes; statistical analysis; EMC; LF statistical estimates; MTL loads; bundle-like configuration; bus-like configuration; current magnitude; electromagnetic compatibility; external susceptibility; field coupling; geometrical parameters; induced currents; line loads; load configurations; low frequencies; multiconductor transmission lines; plane wave incidence direction; polarization; random amplitude; random plane-wave field; random variables; statistical characterization; statistical properties; Couplings; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic modeling; Frequency estimation; Multiconductor transmission lines; Polarization; Random variables; Transmission lines; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.874689
Filename
874689
Link To Document