Title :
Determination of dielectric relaxation time of Langmuir-films using Maxwell displacement current measurement
Author :
Wu, Chen-Xu ; Sato, Yoko ; Majima, Yutaka ; Iwamoto, Mitsumasa
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
In this paper, we provide an approach for determining the dielectric relaxation time of Langmuir films by using a whole curve of Maxwell-displacement-currents (MDCs), and examine the dielectric relaxation time of 4-cyano-4´-alkyl-biphenyl (5CB) monolayers at the air-water interface
Keywords :
Langmuir-Blodgett films; dielectric relaxation; monolayers; organic compounds; 4-cyano-4´-alkyl-biphenyl; 5CB monolayer; Langmuir film; Maxwell displacement current measurement; air-water interface; dielectric relaxation time; Current measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Dielectrics and electrical insulation; Electric variables measurement; Materials science and technology; Monitoring; Time measurement; Water;
Conference_Titel :
Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
Conference_Location :
Toyohashi
Print_ISBN :
4-88686-050-8
DOI :
10.1109/ISEIM.1998.741869
