DocumentCode
2501791
Title
Analysis of a Zener-triggered bipolar ESD structure in a BiCMOS technology
Author
Coffing, Danielle ; Ida, Richard
Author_Institution
Motorola Inc., Tempe, AZ, USA
fYear
1998
fDate
27-29 Sep 1998
Firstpage
31
Lastpage
34
Abstract
A Zener-triggered bipolar ESD structure has been designed in a BiCMOS technology for use as a supply clamp. The current at which the structure snaps back is found to depend on the applied pulse width due to a self-heating effect
Keywords
BiCMOS integrated circuits; Zener diodes; electrostatic discharge; integrated circuit measurement; protection; semiconductor device breakdown; BiCMOS technology; Zener-triggered bipolar ESD structure; applied pulse width; self-heating effect; snap back current level; supply clamp; BiCMOS integrated circuits; Current measurement; Electrostatic discharge; Pulse measurements; Regulators; Size measurement; Space vector pulse width modulation; Switches; Transmission line measurements; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 1998. Proceedings of the 1998
Conference_Location
Minneapolis, MN
ISSN
1088-9299
Print_ISBN
0-7803-4497-9
Type
conf
DOI
10.1109/BIPOL.1998.741874
Filename
741874
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