Title :
Analysis of a Zener-triggered bipolar ESD structure in a BiCMOS technology
Author :
Coffing, Danielle ; Ida, Richard
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Abstract :
A Zener-triggered bipolar ESD structure has been designed in a BiCMOS technology for use as a supply clamp. The current at which the structure snaps back is found to depend on the applied pulse width due to a self-heating effect
Keywords :
BiCMOS integrated circuits; Zener diodes; electrostatic discharge; integrated circuit measurement; protection; semiconductor device breakdown; BiCMOS technology; Zener-triggered bipolar ESD structure; applied pulse width; self-heating effect; snap back current level; supply clamp; BiCMOS integrated circuits; Current measurement; Electrostatic discharge; Pulse measurements; Regulators; Size measurement; Space vector pulse width modulation; Switches; Transmission line measurements; Voltage;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1998. Proceedings of the 1998
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-4497-9
DOI :
10.1109/BIPOL.1998.741874
