DocumentCode
2501925
Title
Defects and reliability analysis of large software systems: field experience
Author
Levendel, Y.
Author_Institution
AT&T Bell Lab., Naperville, IL, USA
fYear
1989
fDate
21-23 June 1989
Firstpage
238
Lastpage
244
Abstract
The contribution of software to the reliability of large distributed systems is addressed. The author analyzes and models the software development process and presents field experience for these large distributed systems. Defect removal is shown to be the bottleneck in achieving the appropriate quality level before system deployment in the field. The author presents a model that relates generic field introduction to the residual defect level and allows reliability prediction since system reliability is related to the residual defect level.<>
Keywords
fault tolerant computing; software reliability; defects; generic field introduction; large distributed systems; large software systems; reliability analysis; residual defect level; software development process; Availability; Communication industry; Computer aided manufacturing; Distributed computing; Military computing; Programming; Reliability; Software systems; Switches; Telecommunication computing;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1989. FTCS-19. Digest of Papers., Nineteenth International Symposium on
Conference_Location
Chicago, IL, USA
Print_ISBN
0-8186-1959-7
Type
conf
DOI
10.1109/FTCS.1989.105573
Filename
105573
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