• DocumentCode
    2502063
  • Title

    A wavelet based technique for suppression of EMG noise and motion artifact in ambulatory ECG

  • Author

    Mithun, P. ; Pandey, Prem C. ; Sebastian, Toney ; Mishra, Prashant ; Pandey, Vinod K.

  • Author_Institution
    Indian Inst. of Technol. Bombay, Mumbai, India
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    7087
  • Lastpage
    7090
  • Abstract
    A wavelet-based denoising technique is investigated for suppressing EMG noise and motion artifact in ambulatory ECG. EMG noise is reduced by thresholding the wavelet coefficients using an improved thresholding function combining the features of hard and soft thresholding. Motion artifact is reduced by limiting the wavelet coefficients. Thresholds for both the denoising steps are estimated using the statistics of the noisy signal. Denoising of simulated noisy ECG signals resulted in an average SNR improvement of 11.4 dB, and its application on ambulatory ECG recordings resulted in L2 norm and max-min based improvement indices close to one. It significantly improved R-peak detection in both the cases.
  • Keywords
    electrocardiography; electromyography; medical signal detection; medical signal processing; signal denoising; EMG noise; R-peak detection; SNR improvement; ambulatory ECG; ambulatory ECG recording; max-min based improvement indices; motion artifact; simulated noisy ECG signals; thresholding function; wavelet coefficients; wavelet-based denoising technique; Electrocardiography; Electromyography; Noise measurement; Noise reduction; Signal to noise ratio; Wavelet coefficients; Algorithms; Artifacts; Computer Simulation; Databases, Factual; Electrocardiography, Ambulatory; Electromyography; Humans; Models, Statistical; Motion; Oscillometry; Reproducibility of Results; Signal Processing, Computer-Assisted; Wavelet Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091791
  • Filename
    6091791