DocumentCode :
25023
Title :
Classification of High-Temperature PEM Fuel Cell Degradation Mechanisms Using Equivalent Circuits
Author :
de Beer, Chris ; Barendse, Paul S. ; Pillay, Pragasen ; Bullecks, Brian ; Rengaswamy, Raghunathan
Author_Institution :
Dept. of Electr. Eng., Adv. Machines & Energy Syst. Group, Univ. of Cape Town, Cape Town, South Africa
Volume :
62
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
5265
Lastpage :
5274
Abstract :
This paper presents the evaluation of a high-temperature proton exchange membrane (HTPEM) fuel cell for different degradation mechanisms using equivalent circuit analysis. Specific consideration is given to the variation of phosphoric acid content in the polybenzimidazole membrane and the effect on the equivalent circuit. The importance of the cell assembly and operating conditions on acid migration are discussed, and it is shown how it affects performance both in the short-term and the long-term operation of the HTPEM cell. A new method is developed, whereby acid leaching can be greatly accelerated in order to quantify performance loss. The change in system parameters as a function of membrane electrode assembly acid content is investigated using electrochemical impedance spectroscopy and compared with the changes that take place for catalyst degradation, CO poisoning, and reactant starvation. It is shown, by using the equivalent circuits, that the drop in performance relating to the individual degradation mechanisms in the cell can be investigated and isolated for fault classification in online diagnostic systems.
Keywords :
electrochemical impedance spectroscopy; equivalent circuits; fault diagnosis; proton exchange membrane fuel cells; CO poisoning; HTPEM cell; acid leaching; acid migration; catalyst degradation; cell assembly; degradation mechanisms; electrochemical impedance spectroscopy; equivalent circuit analysis; fault classification; high-temperature proton exchange membrane fuel cell; long-term operation; membrane electrode assembly acid content; online diagnostic systems; operating conditions; phosphoric acid content; polybenzimidazole membrane; reactant starvation; short-term operation; Assembly; Circuit faults; Degradation; Equivalent circuits; Fuel cells; Leaching; Resistance; Acid leaching; EIS; HTPEM; acid leaching; degradation; electrochemical impedance spectroscopy (EIS); high-temperature proton exchange membrane (HTPEM);
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2015.2393292
Filename :
7014225
Link To Document :
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