DocumentCode :
2502358
Title :
EMI resulting from signal via transitions through the DC power bus
Author :
Cui, Wei ; Ye, Xiaoning ; Archambeault, Bruce ; White, Doug ; Li, Min ; Drewniak, James L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
821
Abstract :
Signal routing with layer changes through via transitions are common in multi-layer printed circuit board (PCB) design. For high-speed signals that transition through the internal parallel planes comprising the DC power bus, the return current has to switch from one reference plane to another reference plane. The return current discontinuity at the via excites the DC power bus and can result in a power bus noise problem, as well as an EMI problem. EMI resulting from the signal transitions through a DC power bus is studied herein. Measurements were made on an experimental board, and numerical modeling was used to study the EMI resulting from the excited DC power bus. The effects of local and global decoupling as an EMI mitigation approach were also studied. In addition, noise coupled to I/O lines, and EMI were studied for a test board with varying layer thickness between the power and ground planes
Keywords :
electromagnetic interference; printed circuit design; printed circuit testing; DC power bus; EMI; I/O lines; PCB design; experimental board; global decoupling; high-speed signals; internal parallel planes; layer changes; layer thickness; local decoupling; measurements; multi-layer printed circuit board design; numerical modeling; power bus noise problem; reference plane; return current; return current discontinuity; signal routing; signal transitions; signal via transitions; Circuit noise; Design engineering; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Laboratories; Printed circuits; Routing; Switches; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
Type :
conf
DOI :
10.1109/ISEMC.2000.874728
Filename :
874728
Link To Document :
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