DocumentCode :
2502438
Title :
A zero X-Y shrinkage low temperature cofired ceramic substrate using Ag and AgPd conductors for flip-chip bonding
Author :
Itagaki, Minehiro ; Bessho, Yoshihiro ; Eda, Kazuo ; Ishida, Tom
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
156
Lastpage :
161
Abstract :
A zero X-Y shrinkage low temperature cofired ceramic (LTCC) substrate was developed, that was applied to the flip-chip bonded chip-size-packages (CSPs) and multi-chip modules (MCMs). The Ag internal conductor,the AgPd external conductor and the newly developed Ag via conductor could be used by matching the sintering shrinkage behavior with that of the zero X-Y shrinkage LTCC substrate. The flip-chip bonding using stud-bump-bonding (SBB) technique could be performed onto the external conductor of this developed substrate without Au plating and stable flip-chip bendability was obtained
Keywords :
ceramics; flip-chip devices; integrated circuit packaging; microassembling; multichip modules; substrates; Ag; Ag internal conductors; Ag via conductor; AgPd; AgPd external conductors; LTCC substrate; MCM; chip-size-packages; flip-chip bonding; low temperature cofired ceramic substrate; multi-chip modules; sintering shrinkage behavior; stud-bump-bonding; zero X-Y shrinkage; Bonding; Ceramics; Conducting materials; Conductors; Glass; Gold; Temperature; Thermal conductivity; Thermal expansion; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559717
Filename :
559717
Link To Document :
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