Title :
A zero X-Y shrinkage low temperature cofired ceramic substrate using Ag and AgPd conductors for flip-chip bonding
Author :
Itagaki, Minehiro ; Bessho, Yoshihiro ; Eda, Kazuo ; Ishida, Tom
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Abstract :
A zero X-Y shrinkage low temperature cofired ceramic (LTCC) substrate was developed, that was applied to the flip-chip bonded chip-size-packages (CSPs) and multi-chip modules (MCMs). The Ag internal conductor,the AgPd external conductor and the newly developed Ag via conductor could be used by matching the sintering shrinkage behavior with that of the zero X-Y shrinkage LTCC substrate. The flip-chip bonding using stud-bump-bonding (SBB) technique could be performed onto the external conductor of this developed substrate without Au plating and stable flip-chip bendability was obtained
Keywords :
ceramics; flip-chip devices; integrated circuit packaging; microassembling; multichip modules; substrates; Ag; Ag internal conductors; Ag via conductor; AgPd; AgPd external conductors; LTCC substrate; MCM; chip-size-packages; flip-chip bonding; low temperature cofired ceramic substrate; multi-chip modules; sintering shrinkage behavior; stud-bump-bonding; zero X-Y shrinkage; Bonding; Ceramics; Conducting materials; Conductors; Glass; Gold; Temperature; Thermal conductivity; Thermal expansion; Wiring;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3642-9
DOI :
10.1109/IEMT.1996.559717