Title :
TEM cell measurements of an active EMC test chip
Author :
de Smedt, Ronald ; Criel, Steven ; Bonjean, Frans ; Spildooren, Guido ; Monier, Guy ; Demoulin, Bernard ; Baudet, Jacques
Author_Institution :
Alcatel Bell Telephone, Antwerp, Belgium
Abstract :
A TEM cell configuration is used to measure the emission effect of an active EMC test chip or of tracks connected to it. A number of parameters have a clear influence on the emission level: clock frequency, inverting 50% of the lines and, to a less extent, giving a relative delay to some lines (staggering). Varying the internal buffers shows the importance of simultaneous switching noise. The track emission is mainly due to H-field coupling, while the chip emission is due to both E- and H-field coupling. The above conclusions are in line with previous direct radiation measurement results
Keywords :
delays; electromagnetic compatibility; electromagnetic coupling; electromagnetic interference; integrated circuit measurement; integrated circuit noise; integrated circuit testing; test facilities; E-field coupling; H-field coupling; TEM cell measurements; active EMC test chip; chip emission; clock frequency; emission effect measurement; internal buffers; radiation measurement results; relative delay; simultaneous switching noise; track emission; Antenna measurements; Crosstalk; Electromagnetic compatibility; Integrated circuit noise; Logic testing; Noise generators; Pollution measurement; Qualifications; Semiconductor device measurement; TEM cells;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.874743
