DocumentCode :
2502676
Title :
Characterization and design of sequentially t-diagnosable systems
Author :
Huang, S. ; Xu, J. ; Chen, T.
Author_Institution :
Comput. Res. Inst., Chongqing Univ., China
fYear :
1989
fDate :
21-23 June 1989
Firstpage :
554
Lastpage :
559
Abstract :
In the system-level diagnosis area, F.P. Preparata, G. Metze, and R.T. Chien (1967) first presented a formal graph-theoretic model and introduced the concept of sequentially t-diagnosable systems. A system S is called sequentially t-diagnosable if, given any complete collection of test results, at least one faulty unit in S can be identified, provided the number of faulty units does not exceed t. However, until very recently, developing a characterization theorem of sequentially t-diagnosable systems for the PMC model was still an important, open problem. The authors resolve this problem by presenting the first complete characterization. A canonical class of systems, D/sub 1,k/ systems, is discussed, and a valuable result on the sequential t-diagnosability is obtained.<>
Keywords :
failure analysis; fault tolerant computing; graph theory; reliability theory; D/sub 1,k/ systems; PMC model; canonical class; characterization theorem; design; faulty unit; graph-theoretic model; open problem; sequentially t-diagnosable systems; system-level diagnosis; test results; Fault diagnosis; Large-scale systems; Sequential analysis; Sequential diagnosis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1989. FTCS-19. Digest of Papers., Nineteenth International Symposium on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-8186-1959-7
Type :
conf
DOI :
10.1109/FTCS.1989.105635
Filename :
105635
Link To Document :
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