DocumentCode
2502679
Title
Comparison of site-to-site measurement reproducibility using UK National Physical Laboratory and Austrian Research Center test sites as a reference
Author
Hall, Ken ; Pommerenke, David ; Kolb, Lowell
Author_Institution
Hewlett-Packard Co., Roseville, CA, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
939
Abstract
Twenty Radiated emission sites are compared using a sinusoidal reference transmitter in the frequency range of 30 to 1000 MHz. The data is referenced to results measured on the UK National Physical Laboratory and Austrian Research Centers reference sites. The data on nineteen site is reported in this article, the data on the one remaining was done at three meters and not comparable. Of the nineteen sites, nine performed from four to six measurements on different days and usually with different people. Statistically, the results of these nine sites show 95% of the measurements made were within +/-2.1 dB from the average of the reference sites. Test result differences in repeated EMC tests are partially caused by physical characteristics of the measurement sites and changes or differences in the measurement chain. This program has met the requirements of A2LA and NVLAP for site-to-site comparisons. Being programmable the source could be easily adaptable to “blind” proficiency assessments
Keywords
electromagnetic compatibility; electromagnetic interference; laboratories; measurement standards; test facilities; A2LA; Austrian Research Center; HF; NVLAP; UHF; UK National Physical Laboratory; VHF; blind proficiency assessments; frequency range; measurement sites; programmable source; reference sites; repeated EMC tests; sinusoidal reference transmitter; site-to-site measurement reproducibility; statistics; test results; test sites; Area measurement; Costs; Electromagnetic compatibility; Laboratories; Performance evaluation; Pulse shaping methods; Reproducibility of results; Shape; Testing; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.874749
Filename
874749
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