DocumentCode :
2502758
Title :
Evaluation of Crystal Measurement Systems
Author :
Smythe, R.C. ; Horton, W.H.
fYear :
1983
fDate :
1-3 June 1983
Firstpage :
290
Lastpage :
296
Keywords :
Electrical resistance measurement; Frequency measurement; Frequency synthesizers; Impedance measurement; Instruments; Microprocessors; Particle measurements; Radio frequency; Resonance; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
37th Annual Symposium on Frequency Control. 1983
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1983.200682
Filename :
1537622
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2502758
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