Title :
Comprehensive online defect diagnosis in on-chip networks
Author :
Ghofrani, AmirAli ; Parikh, Ritesh ; Shamshiri, Saeed ; DeOrio, Andrew ; Cheng, Kwang-Ting ; Bertacco, Valeria
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
Abstract :
We propose a comprehensive yet low-cost solution for online detection and diagnosis of permanent faults in on-chip networks. Using error syndrome collection and packet/flit-counting techniques, high-resolution defect diagnosis is feasible in both datapath and control logic of the on-chip network without injecting any test traffic or incurring significant performance overhead.
Keywords :
fault diagnosis; integrated circuit testing; network-on-chip; comprehensive online defect diagnosis; control logic; datapath; error syndrome collection; high-resolution defect diagnosis; on-chip network; online permanent fault detection; online permanent fault diagnosis; packet-flit-counting technique; Accuracy; Circuit faults; Error correction codes; Probability; Radiation detectors; Routing; Transient analysis; Network-on-Chip; error correcting codes; fault-tolerant router; online diagnosis; permanent faults;
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Hyatt Maui, HI
Print_ISBN :
978-1-4673-1073-4
DOI :
10.1109/VTS.2012.6231078
