• DocumentCode
    2502952
  • Title

    Hierarchical Decomposition of Handwriting Deformation Vector Field for Improving Recognition Accuracy

  • Author

    Wakahara, Toru ; Uchida, Seiichi

  • Author_Institution
    Fac. of Comput. & Inf. Sci., Hosei Univ., Koganei, Japan
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    1860
  • Lastpage
    1863
  • Abstract
    This paper addresses the problem of how to extract, describe, and evaluate handwriting deformation from the deterministic viewpoint for improving recognition accuracy. The key ideas are threefold. The first is to extract handwriting deformation vector field (DVF) between a pair of input and target images by 2D warping. The second is to hierarchically decompose the DVF by a parametric deformation model of global/local affine transformation, where local affine transformation is iteratively applied to the DVF by decreasing window sizes. The third is to accept only low-order deformation components as natural, within-class handwriting deformation. Experiments using the handwritten numeral database IPTP CDROM1B show that correlation-based matching absorbing components of global affine transformation and local affine transformation up to the 3rd order achieved a higher recognition rate of 92.1% than that of 87.0% obtained by original 2D warping.
  • Keywords
    affine transforms; correlation methods; feature extraction; handwriting recognition; image matching; 2D warping; correlation-based matching; global affine transformation; handwriting deformation extraction; handwriting deformation vector field; handwritten numeral database IPTP CDROM1B; hierarchical decomposition; local affine transformation; low-order deformation component; parametric deformation model; recognition accuracy; window size; Accuracy; Databases; Deformable models; Gray-scale; Handwriting recognition; Optimization; 2D warping; character recognition; global/local affine transformation; handwriting deformation vector field;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.459
  • Filename
    5597196