• DocumentCode
    2503041
  • Title

    Parameter estimation-based single image super resolution

  • Author

    Han, Yunsang ; Chae, Tae Byeong ; Lee, Sangkeun

  • Author_Institution
    Imaging Eng., GSAIM at Chung-Ang Univ., Seoul, South Korea
  • fYear
    2012
  • fDate
    2-5 Oct. 2012
  • Firstpage
    560
  • Lastpage
    563
  • Abstract
    In this paper, we introduce a parameter estimation-based single image super resolution technique. The basic idea of the proposed method is to use the property of unknown high resolution image inferred by relations of its lower resolution images. The proposed algorithm is consists of 3 main phases: 1) in the first step, an error model between an input and its lower resolution images is constructed for inferring the property of unknown high resolution image; 2) In the second step, global enhancement using estimated signal complexity and its strength is performed. 3) Lastly, independent enhancement in artifact candidate regions is performed in estimated artifact candidate regions with artifact removal using property of morphological operation. The experimental results show the efficiency of the proposed algorithm compared to a state-of-the-art method. Besides, the proposed method is not only much faster than the compared method but also able to implement in hard ware such as digital TVs and smart phones. Therefore, we believe that the proposed method can be a useful tool for super resolution-related consumer electronics fields.
  • Keywords
    consumer electronics; image resolution; parameter estimation; consumer electronics; error model; global enhancement; lower resolution images; parameter estimation; signal complexity; single image super resolution; Complexity theory; Consumer electronics; Estimation; Image resolution; Interpolation; Morphological operations; Signal resolution; Parameter Estimation; Resolution Enhancement; Super Resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (GCCE), 2012 IEEE 1st Global Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4673-1500-5
  • Type

    conf

  • DOI
    10.1109/GCCE.2012.6379911
  • Filename
    6379911