DocumentCode :
2503108
Title :
A reliable and environmentally friendly packaging technology-flip chip joining using anisotropically conductive adhesive
Author :
Tolvgård, Arne ; Malmodin, J. ; Liu, Johan ; Lai, Zonghe
Author_Institution :
Cellular Syst., Ericsson Radio Syst. AB, Kista, Sweden
fYear :
1998
fDate :
28-30 Sep 1998
Firstpage :
19
Lastpage :
26
Abstract :
There is increasing demand to move radio base stations closer to the antenna for future mobile telecommunication systems, which requires significant reduction in weight, volume and environmental compatibility. In this work, an evaluation of environmental impact and reliability when using anisotropically conductive adhesives (ACA) for flip-chip joining in radio base station applications has been performed. Conventional FR-4 substrates were used to assemble a digital ASIC chip using an anisotropically conductive adhesive and flip-chip technology. The chip has a minimum pitch of 128 μm with a chip size of 7.76 mm and has a total of 216 bumps with bump size of 108×120 μm using electroless nickel/gold bumping technology. The bonding quality was characterized by optical and scanning electron microscopy and substrate planarity measurement. Main quality-affecting parameters are misalignment and softening of the FR-4 substrate during assembly, which lead to high joint resistance. Reliability testing was conducted in a temperature cycling test between -40 and +125°C for 1000 cycles, a 125°C aging test for 1000 hours and a humidity test 85°C/85% RH, 500 hours. The results show that relatively small resistance change was observed after reliability testing. The environmental impact evaluation was conducted as a material content declaration and as a life cycle assessment (LCA). By using flip-chip ACA joining technology, the environmentally hazardous materials content was reduced more than ten times and the use of precious metals was reduced by more than 30 times compared to conventional SMT
Keywords :
adhesives; ageing; application specific integrated circuits; conducting polymers; environmental factors; flip-chip devices; humidity; integrated circuit bonding; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; optical microscopy; scanning electron microscopy; thermal stresses; -40 to 125 C; 1000 hr; 108 micron; 120 micron; 128 micron; 500 hr; 7.76 mm; 85 C; FR-4 substrate softening; FR-4 substrates; Ni-Au; aging test; anisotropically conductive adhesive; assembly; bonding quality; bump size; chip minimum pitch; chip size; digital ASIC chip; electroless nickel/gold bumping technology; environmental compatibility; environmental impact; environmental impact evaluation; environmentally friendly packaging technology; environmentally hazardous materials content; flip chip joining; flip-chip ACA joining technology; flip-chip technology; humidity test; joint resistance; life cycle assessment; material content declaration; misalignment; mobile telecommunication systems; optical microscopy; precious metals usage; quality; radio antenna; radio base stations; reliability; reliability testing; reliable packaging technology; resistance; scanning electron microscopy; substrate planarity measurement; temperature cycling test; Anisotropic magnetoresistance; Application specific integrated circuits; Assembly; Base stations; Conductive adhesives; Mobile antennas; Optical microscopy; Packaging; Performance evaluation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
Conference_Location :
Binghamton, NY
Print_ISBN :
0-7803-4934-2
Type :
conf
DOI :
10.1109/ADHES.1998.741997
Filename :
741997
Link To Document :
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