Title :
VTS 2011 Best Paper Award
Author :
Prinetto, Paolo ; Maxwell, Peter ; Varma, Prab ; Singh, Adit ; Thibeault, Claude
Author_Institution :
Politecnico di Torino, Italy
Abstract :
Each year, VTS proudly presents the Best Paper Award to the author(s) of the most outstanding paper from those presented at the previous year´s symposium. The candidates for this honor are initially selected based solely on the numerical ratings of the reviewers and symposium attendees, as recorded on the review forms and the session rating cards. The Best Paper Award Judges then carefully review the candidate papers as published in the proceedings. The judges provide numerical scores and comments for each candidate paper. The scores and comments are compiled to select the best paper.
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Maui, HI, USA
Print_ISBN :
978-1-4673-1073-4
DOI :
10.1109/VTS.2012.6231109