DocumentCode
2503400
Title
Conference committees
fYear
2012
fDate
23-25 April 2012
Abstract
Provides a listing of current committee members.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location
Maui, HI, USA
ISSN
1093-0167
Print_ISBN
978-1-4673-1073-4
Type
conf
DOI
10.1109/VTS.2012.6231112
Filename
6231112
Link To Document