DocumentCode :
2503400
Title :
Conference committees
fYear :
2012
fDate :
23-25 April 2012
Abstract :
Provides a listing of current committee members.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Maui, HI, USA
ISSN :
1093-0167
Print_ISBN :
978-1-4673-1073-4
Type :
conf
DOI :
10.1109/VTS.2012.6231112
Filename :
6231112
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2503400
