مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2503425

Title :

TTTC: Test Technology Technical Council

fYear :

2012

fDate :

23-25 April 2012

Abstract :

This work describes the purpose, activities and lists membership of the IEEE Computer Society TTTC: Test Technology Technical Council.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium (VTS), 2012 IEEE 30th

Conference_Location :

Maui, HI, USA

ISSN :

1093-0167

Print_ISBN :

978-1-4673-1073-4

Type :

conf

DOI :

10.1109/VTS.2012.6231113

Filename :

6231113

Link To Document :