DocumentCode
2503591
Title
Materials mechanics issues of smart card manufacturing
Author
Schubert, A. ; Michel, B. ; Reichl, H.
Author_Institution
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear
1996
fDate
14-16 Oct 1996
Firstpage
176
Lastpage
181
Abstract
Smart cards offer some advantages, e.g., for replacement of cash, storage of personal data of any kind, electronic identification, access control, data encryption, and electronic signature. Application areas are banking, telecommunication, high security, and social service. Permissible mechanical and thermal loads to smart cards call for respective high quality packaging technologies. Furthermore, the prediction of smart card performance during manufacturing and service requires the description of stress and temperature of the dependent processes involved. A complete solution of the described problems needs a direct coupling between simulation tools and advanced physical experiments. Finite Element simulations together with appropriate failure and fatigue models allow to predict the life time of these configurations and to improve the same by material or geometry variation. Because of the high degree of component and material complexity in such configurations, an experimental verification of simulation results for particular cases is strongly indicated. Capabilities of modern measurement and testing techniques, as for example micro deformation analysis, scanning acoustic microscopy and the measurement of residual stresses by X-ray diffraction, are demonstrated and discussed in the following paper
Keywords
X-ray diffraction; acoustic microscopy; finite element analysis; integrated circuit packaging; internal stresses; smart cards; X-ray diffraction; failure model; fatigue model; finite element simulation; lifetime; mechanical load; micro deformation analysis; packaging; residual stress measurement; scanning acoustic microscopy; smart card manufacturing; thermal load; Access control; Acoustic measurements; Banking; Cryptography; Electronic packaging thermal management; Manufacturing; Predictive models; Smart cards; Solid modeling; Stress measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-3642-9
Type
conf
DOI
10.1109/IEMT.1996.559723
Filename
559723
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