DocumentCode :
2503591
Title :
Materials mechanics issues of smart card manufacturing
Author :
Schubert, A. ; Michel, B. ; Reichl, H.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
176
Lastpage :
181
Abstract :
Smart cards offer some advantages, e.g., for replacement of cash, storage of personal data of any kind, electronic identification, access control, data encryption, and electronic signature. Application areas are banking, telecommunication, high security, and social service. Permissible mechanical and thermal loads to smart cards call for respective high quality packaging technologies. Furthermore, the prediction of smart card performance during manufacturing and service requires the description of stress and temperature of the dependent processes involved. A complete solution of the described problems needs a direct coupling between simulation tools and advanced physical experiments. Finite Element simulations together with appropriate failure and fatigue models allow to predict the life time of these configurations and to improve the same by material or geometry variation. Because of the high degree of component and material complexity in such configurations, an experimental verification of simulation results for particular cases is strongly indicated. Capabilities of modern measurement and testing techniques, as for example micro deformation analysis, scanning acoustic microscopy and the measurement of residual stresses by X-ray diffraction, are demonstrated and discussed in the following paper
Keywords :
X-ray diffraction; acoustic microscopy; finite element analysis; integrated circuit packaging; internal stresses; smart cards; X-ray diffraction; failure model; fatigue model; finite element simulation; lifetime; mechanical load; micro deformation analysis; packaging; residual stress measurement; scanning acoustic microscopy; smart card manufacturing; thermal load; Access control; Acoustic measurements; Banking; Cryptography; Electronic packaging thermal management; Manufacturing; Predictive models; Smart cards; Solid modeling; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559723
Filename :
559723
Link To Document :
بازگشت