Title :
Single View Metrology Along Orthogonal Directions
Author :
Peng, Kun ; Hou, Lulu ; Ren, Ren ; Ying, Xianghua ; Zha, Hongbin
Author_Institution :
Key Lab. of Machine Perception (Minist. of Eduction), Peking Univ., Beijing, China
Abstract :
In this paper, we describe how 3D metric measurements can be determined from a single uncalibrated image, when only minimal geometric information are available in the image. The minimal information just is orthogonal vanishing points. Given such limited information, we show that the length ratios on different orthogonal directions can be directly computed. The exciting discovery of the method seems to oppose common senses: Usually, in the calibration process, all edge-lengths of cuboid are known, in this paper, cuboid edge-lengths are unknown but its edge-lengths ratios can be recovered from image. 3D metric measurements can be directly computed from the image using our linear method.
Keywords :
geometry; image processing; solid modelling; 3D metric measurement; calibration process; cuboid edge-length; geometric information; length ratio; orthogonal direction; orthogonal vanishing point; single uncalibrated image; single view metrology; Calibration; Cameras; Computer vision; Length measurement; Metrology; Three dimensional displays; 3D metric measurements; Linear method; Orthogonal vanishing points; Single uncalibrated image;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.410