DocumentCode :
2503733
Title :
Scintillation Light, Ionization Yield and Scintillation Decay Times in High Pressure Xenon and Xenon Methane
Author :
Pushkin, K.N. ; Akimov, D.Y. ; Burenkov, A.A. ; Dmitrenko, V.V. ; Kovalenko, A.G. ; Lebedenko, V.N. ; Kuznetsov, I.S. ; Stekhanov, V.N. ; Tezuka, C. ; Ulin, S.E. ; Uteshev, Z.M. ; Vlasik, K.F.
Author_Institution :
Inst. of Theor. & Exp. Phys., Moscow
Volume :
2
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
1021
Lastpage :
1027
Abstract :
Scintillation light, ionization yield and scintillation decay times have been measured in xenon and in its mixture with a 0.05% concentration of methane as a function of the reduced electric field (E/N) - the ratio of the electric field strength to the gas density - at a pressure of 21 atm. The measurements of scintillation decay times in the xenon-methane mixture have been made for the first time as a function of the reduced electric field (E/N). An ionization chamber has been constructed to simultaneously measure electrons and photons from a 239Pu source, which is placed in the center of a cathode in the chamber. The main peculiarity of the chamber is a moveable cathode to measure scintillation light and ionization yield at various distances from the anode and monitor the purity of the investigated gas. It has been observed that both scintillation light and ionization yield decrease when methane is added into the xenon gas. Scintillation decay times in the xenon-methane mixture are observed to be longer than in the pure xenon when the electric field strength increases.
Keywords :
electron beam effects; gamma-ray effects; gas mixtures; gas scintillation detectors; ionisation; ionisation chambers; organic compounds; radiative lifetimes; scintillation; xenon; 21 atm; 239Pu source; Xe; gas purity; high pressure xenon; high pressure xenon-methane mixture; ionization chamber; ionization yield; reduced electric field; scintillation decay times; scintillation light; Anodes; Cathodes; Density measurement; Electric variables measurement; Electrons; Ionization chambers; Motion measurement; Pressure measurement; Time measurement; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.356020
Filename :
4179174
Link To Document :
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