• DocumentCode
    2503856
  • Title

    An X-Ray Irradiation System for Total-Dose Testing of Quartz Resonators

  • Author

    Palku, Leslie J. ; Truong, Quang T.

  • fYear
    1984
  • fDate
    May 29 1984-June 1 1984
  • Firstpage
    55
  • Lastpage
    62
  • Keywords
    Circuit testing; Frequency measurement; Instruments; Oscillators; Ovens; Semiconductor device modeling; Semiconductor device testing; System testing; Temperature control; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    38th Annual Symposium on Frequency Control. 1984
  • Conference_Location
    Philadelphia, Pennsylvania, USA
  • Type

    conf

  • DOI
    10.1109/FREQ.1984.200737
  • Filename
    1537677