Title :
Conductive adhesives with improved thermomechanical properties
Author :
Schaefer, H. ; Guenther, B. ; Battermann, A. ; Haug, R. ; Brielmann, V.
Author_Institution :
Fraunhofer-Inst. fur Angewandte Materialforschung, Bremen, Germany
Abstract :
In this work, a new type of isotropically conductive adhesive (ICA) for microelectronic applications is presented. An extremely low value of ionic impurity content in the ICA is realized by using a cycloaliphatic epoxy resin. The brittle behaviour of this type of resin has been counterbalanced by introducing porous silver nanopowders as a conductive filler material instead of conventional silver flakes. In this way, a considerable reduction in metal filler content is achieved at still acceptably low values of electrical resistivity. It is shown that the mechanical properties under shear loading are improved considerably when using the nanopowder/epoxy composites as compared to ICAs based on Ag flakes. This new ICA is therefore particularly suited for bonding substrates and components which differ strongly with respect to their coefficient of thermal expansion
Keywords :
adhesives; conducting polymers; electrical resistivity; filled polymers; integrated circuit bonding; integrated circuit packaging; nanostructured materials; porous materials; silver; thermal expansion; Ag; Ag flakes; ICAs; brittle behaviour; coefficient of thermal expansion; conductive adhesives; cycloaliphatic epoxy resin; electrical resistivity; ionic impurity content; isotropically conductive adhesive; mechanical properties; metal filler content; microelectronic applications; nanopowder/epoxy composites; porous silver nanopowder conductive filler material; shear loading; silver flakes; substrate-component bonding; thermomechanical properties; Conducting materials; Conductive adhesives; Electric resistance; Epoxy resins; Impurities; Independent component analysis; Microelectronics; Nanoparticles; Silver; Thermomechanical processes;
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
Conference_Location :
Binghamton, NY
Print_ISBN :
0-7803-4934-2
DOI :
10.1109/ADHES.1998.742040