• DocumentCode
    2504040
  • Title

    CPM measurements on a-Si:H based pin cells-a critical investigation

  • Author

    Geyer, R. ; Gorn, M. ; Kniffler, N. ; Lechner, P. ; Rübel, H. ; Scheppat, B.

  • Author_Institution
    MBB Energy & Process Technol., Munich, West Germany
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    340
  • Abstract
    The subband gap optical absorption spectra of amorphous hydrogenated silicon p-i-n solar cells were investigated by photocurrent spectroscopy in the CPM (constant photocurrent method) mode. A comparative study was made of thin (standard) and thick p-i-n junctions as well as junctions with slightly n- and p-doped active layers. Characteristic dependencies on the applied bias voltages (forward and reverse bias and short-circuit case) were observed. A critical discussion of these results in comparison to standard measurements (I-V curves under illumination, spectral response) is given. It is found that Urbach energies (slope of the exponential tail) are not voltage bias dependent and show, in the cases observed, the expected enhancement in p- nu -n and p- pi -n diodes with respect to p-i-n diodes.
  • Keywords
    amorphous semiconductors; elemental semiconductors; hydrogen; photoconductivity; silicon; solar cells; I-V characteristics; Si:H solar cells; Urbach energies; amorphous semiconductors; applied bias voltages; constant photocurrent method; p-i-n junctions; subband gap optical absorption spectra; Absorption; Amorphous materials; Measurement standards; P-i-n diodes; PIN photodiodes; Photoconductivity; Photovoltaic cells; Silicon; Spectroscopy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105718
  • Filename
    105718