DocumentCode
2504040
Title
CPM measurements on a-Si:H based pin cells-a critical investigation
Author
Geyer, R. ; Gorn, M. ; Kniffler, N. ; Lechner, P. ; Rübel, H. ; Scheppat, B.
Author_Institution
MBB Energy & Process Technol., Munich, West Germany
fYear
1988
fDate
1988
Firstpage
340
Abstract
The subband gap optical absorption spectra of amorphous hydrogenated silicon p-i-n solar cells were investigated by photocurrent spectroscopy in the CPM (constant photocurrent method) mode. A comparative study was made of thin (standard) and thick p-i-n junctions as well as junctions with slightly n- and p-doped active layers. Characteristic dependencies on the applied bias voltages (forward and reverse bias and short-circuit case) were observed. A critical discussion of these results in comparison to standard measurements (I-V curves under illumination, spectral response) is given. It is found that Urbach energies (slope of the exponential tail) are not voltage bias dependent and show, in the cases observed, the expected enhancement in p- nu -n and p- pi -n diodes with respect to p-i-n diodes.
Keywords
amorphous semiconductors; elemental semiconductors; hydrogen; photoconductivity; silicon; solar cells; I-V characteristics; Si:H solar cells; Urbach energies; amorphous semiconductors; applied bias voltages; constant photocurrent method; p-i-n junctions; subband gap optical absorption spectra; Absorption; Amorphous materials; Measurement standards; P-i-n diodes; PIN photodiodes; Photoconductivity; Photovoltaic cells; Silicon; Spectroscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105718
Filename
105718
Link To Document