• DocumentCode
    2504051
  • Title

    Some aspects on the saturation level and the origin of metastable defects in a-Si:H (solar cells)

  • Author

    Schneider, U. ; Sopka, J. ; Schröder, B. ; Oechsner, H.

  • Author_Institution
    Fachbereich Phys., Kaiserslautern Univ., West Germany
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    346
  • Abstract
    Using the method of keV-electron irradiation to create metastable (Staebler-Wronski-like) defects in hydrogenated amorphous silicon, a saturation level of about 1018 spins/cm3 has been found for high-dose irradiation (up to 300 J/cm2). The saturation effect which becomes perceptible for electron doses exceeding Qel=50 J/cm2 has been investigated by electron spin resonance and photoconductivity spectroscopy (constant photocurrent mode) measurements. Annealing experiments were used to exemplify the identity of the defects induced by light and by keV-electron irradiation. No differences concerning the defect creation and saturation could be found between glow discharge and a-Si:H and magnetron-sputtered a-Si:H films, the latter containing extremely few oxygen impurities (less than 3*1018 oxygen atoms per cm3). From this fact it is concluded that oxygen does not play an important role in the defect creation process.
  • Keywords
    amorphous semiconductors; annealing; electron beam effects; elemental semiconductors; hydrogen; noncrystalline state structure; paramagnetic resonance of defects; photoconductivity; silicon; solar cells; Si:H solar cells; defect creation; electron doses; electron spin resonance; keV-electron irradiation; metastable defects; photoconductivity spectroscopy; saturation level; semiconductor; Amorphous silicon; Annealing; Electrons; Glow discharges; Metastasis; Paramagnetic resonance; Photoconductivity; Photovoltaic cells; Q measurement; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105719
  • Filename
    105719