Title :
Time-frequency characterization of mismatch negativity in nociceptive responses
Author :
Melia, Umberto S P ; Vallverdú, Montserrat ; Clariá, Francesc ; Casanova, Jordi ; Valls-Solé, Josep ; Caminal, Pere
Author_Institution :
Dept. ESAII, Univ. Politec. de Catalunya, Barcelona, Spain
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
An efficient way to investigate the neural basis of nociceptive responses is the event-related brain potentials (ERPs). One component belonging to this family of ERPs is the mismatch negativity (MMN). It reflects pre-attentive detection of changes in the incoming stimulus by comparing the new stimulus with sensory memory traces. In this work, single trials of ERP taken from EEG signal recorded under thermal and electric stimulation were analyzed with time-frequency representation (TFR). The main objective of this work was to characterize responses to frequent and infrequent stimuli with TFR functions. Variables defined on instantaneous frequency and instantaneous power presented a statistical significance (p-value<;0.0001) differentiating these two kind of responses. Furthermore, differences between the averaged instantaneous power and instantaneous frequency were also analyzed. It was found that instantaneous power and instantaneous frequency were able to better isolate the MMN components from EEG noise in certain frequency bands.
Keywords :
bioelectric potentials; electroencephalography; statistical analysis; time-frequency analysis; EEG signal noise; ERP; event-related brain potentials; instantaneous frequency; instantaneous power; mismatch negativity; nociceptive responses; time-frequency characterization; time-frequency representation; Electroencephalography; Hafnium; Noise; Thermal analysis; Thumb; Time frequency analysis; Adult; Electric Stimulation; Electroencephalography; Evoked Potentials; Female; Humans; Male; Middle Aged; Nociception; Temperature; Time Factors; Young Adult;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091902