• DocumentCode
    2504109
  • Title

    Analytical chemical diagnostic testing of environmental exposed thin-film PV modules

  • Author

    Longrigg, P. ; Nelson, A.J. ; Swartzlander, A.B. ; Matson, R.

  • Author_Institution
    Solar Energy Res. Inst., Golden, CO, USA
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    361
  • Abstract
    Environmentally exposed thin-film a-Si modules were tested using Auger spectroscopy and electron and optical microscopy. The results seem to indicate that there is a serious corrosion problem associated with thin-film PV (photovoltaic) modules. This is considered to be primarily due to the permeation of water through the organic protective encapsulations. Such materials are all water permeable to some extent. If the module life expectancy is to be fixed in the 20-to-30 year range, then it is felt that further research is needed to find encapsulant materials that will act as effective water barriers for this period of time.
  • Keywords
    Auger effect; amorphous semiconductors; electron microscopy; electron spectroscopy; elemental semiconductors; life testing; optical microscopy; semiconductor thin films; silicon; solar cells; Auger spectroscopy; Si solar cels; amorphous semiconductor thin films; corrosion; diagnostic testing; electron microscopy; life expectancy; optical microscopy; water barriers; Chemical analysis; Corrosion; Electron microscopy; Electron optics; Optical films; Optical microscopy; Photovoltaic systems; Spectroscopy; Testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105722
  • Filename
    105722