DocumentCode
2504109
Title
Analytical chemical diagnostic testing of environmental exposed thin-film PV modules
Author
Longrigg, P. ; Nelson, A.J. ; Swartzlander, A.B. ; Matson, R.
Author_Institution
Solar Energy Res. Inst., Golden, CO, USA
fYear
1988
fDate
1988
Firstpage
361
Abstract
Environmentally exposed thin-film a-Si modules were tested using Auger spectroscopy and electron and optical microscopy. The results seem to indicate that there is a serious corrosion problem associated with thin-film PV (photovoltaic) modules. This is considered to be primarily due to the permeation of water through the organic protective encapsulations. Such materials are all water permeable to some extent. If the module life expectancy is to be fixed in the 20-to-30 year range, then it is felt that further research is needed to find encapsulant materials that will act as effective water barriers for this period of time.
Keywords
Auger effect; amorphous semiconductors; electron microscopy; electron spectroscopy; elemental semiconductors; life testing; optical microscopy; semiconductor thin films; silicon; solar cells; Auger spectroscopy; Si solar cels; amorphous semiconductor thin films; corrosion; diagnostic testing; electron microscopy; life expectancy; optical microscopy; water barriers; Chemical analysis; Corrosion; Electron microscopy; Electron optics; Optical films; Optical microscopy; Photovoltaic systems; Spectroscopy; Testing; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105722
Filename
105722
Link To Document