Title :
Analytical chemical diagnostic testing of environmental exposed thin-film PV modules
Author :
Longrigg, P. ; Nelson, A.J. ; Swartzlander, A.B. ; Matson, R.
Author_Institution :
Solar Energy Res. Inst., Golden, CO, USA
Abstract :
Environmentally exposed thin-film a-Si modules were tested using Auger spectroscopy and electron and optical microscopy. The results seem to indicate that there is a serious corrosion problem associated with thin-film PV (photovoltaic) modules. This is considered to be primarily due to the permeation of water through the organic protective encapsulations. Such materials are all water permeable to some extent. If the module life expectancy is to be fixed in the 20-to-30 year range, then it is felt that further research is needed to find encapsulant materials that will act as effective water barriers for this period of time.
Keywords :
Auger effect; amorphous semiconductors; electron microscopy; electron spectroscopy; elemental semiconductors; life testing; optical microscopy; semiconductor thin films; silicon; solar cells; Auger spectroscopy; Si solar cels; amorphous semiconductor thin films; corrosion; diagnostic testing; electron microscopy; life expectancy; optical microscopy; water barriers; Chemical analysis; Corrosion; Electron microscopy; Electron optics; Optical films; Optical microscopy; Photovoltaic systems; Spectroscopy; Testing; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/PVSC.1988.105722
