DocumentCode :
2504242
Title :
Overcomplete expansions and robustness
Author :
Cvetkovic, Zoran ; Vetterli, Martin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA
fYear :
1996
fDate :
18-21 Jun 1996
Firstpage :
325
Lastpage :
328
Abstract :
The motivation for the development of the theory of time-frequency and time-scale expansions towards wavelet and Weyl-Heisenberg frames stems mainly from the design freedom which is usually attained with overcomplete expansions. Also, it has been observed that for a given accuracy of representation overcomplete expansions allow for a progressively coarser quantization provided that the redundancy is increased. Increased robustness of overcomplete expansions compared to nonredundant ones is manifested for two primary sources of degradation, white additive noise and quantization. Reconstruction from expansion coefficients adulterated by an additive noise reduces the noise effect by a factor proportional to the expansion redundancy. We conjecture that the effect of the quantization error can be reduced inversely to the square of the expansion redundancy and prove that result in two particular cases, Weyl-Heisenberg expansions and oversampled A/D conversion
Keywords :
quantisation (signal); signal reconstruction; signal representation; signal sampling; time-frequency analysis; wavelet transforms; white noise; Weyl-Heisenberg expansions; Weyl-Heisenberg frames; expansion coefficients; expansion redundancy; overcomplete expansions; oversampled A/D conversion; quantization error; robustness; signal reconstruction; signal representation; time-frequency expansion; time-scale expansion; wavelets; white additive noise; Additive noise; Degradation; Frequency; Image reconstruction; Noise reduction; Noise robustness; Quantization; Redundancy; Systems engineering and theory; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Time-Frequency and Time-Scale Analysis, 1996., Proceedings of the IEEE-SP International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-7803-3512-0
Type :
conf
DOI :
10.1109/TFSA.1996.547479
Filename :
547479
Link To Document :
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