DocumentCode
2504303
Title
High efficiency GaAs/Ge monolithic tandem solar cells
Author
Tobin, S.P. ; Vernon, S.M. ; Bajgar, C. ; Haven, V.E. ; Geoffroy, L.M. ; Sanfacon, M.M. ; Lillington, D.R. ; Hart, R.E., Jr. ; Emery, K.A. ; Matson, R.J.
Author_Institution
Spire Corp., Bedford, MA, USA
fYear
1988
fDate
1988
Firstpage
405
Abstract
Two-terminal monolithic tandem cells consisting of a GaAs solar cell grown epitaxially on a Ge solar cell substrate are very attractive for space power applications. Tandem cells of GaAs grown by metal-organic chemical vapor deposition on thin Ge were investigated to address both higher efficiency and reduced weight. Two materials growth issues associated with this heteroepitaxial system, autodoping of the GaAs layers by Ge and diffusion of Ga and As into the Ge substrate, were addressed. The latter appears to result in information of an unintentional p-n junction in the Ge. Early simulator measurements gave efficiencies as high as 21.7% for 4 cm2 GaAs/Ge cells, but recent high-altitude testing has given efficiencies of 18%. Sources of errors in simulator measurements of two-terminal tandem cells are discussed. A limiting efficiency of about 36% for the tandem cell at AMO was calculated. Ways to improve the performance of present cells, primarily by increasing the Isc and Voc of the Ge cell, are proposed.
Keywords
III-V semiconductors; elemental semiconductors; gallium arsenide; germanium; solar cells; space vehicle power plants; 18 percent; 21.7 percent; 36 percent; GaAs-Ge; efficiency; metal-organic chemical vapor deposition; monolithic tandem solar cells; p-n junction; performance; space power; testing; weight; Chemical vapor deposition; Coatings; Gallium arsenide; Lithography; MOCVD; NASA; P-n junctions; Photovoltaic cells; Photovoltaic systems; Substrates; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105732
Filename
105732
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