Title :
Simulate surface acoustic wave devices using VHDL-AMS
Author :
Fu, Qiuyun ; Fischer, Wolf-Joachim ; Stab, Helmut
Author_Institution :
Dept. of Technol. of Electron. & Inf., Technische Univ. Dresden, Germany
Abstract :
Network analyzer is the main instrument to measure SAW (surface acoustic wave) devices. Many research workers are familiar with the results coming from network analyzer. From this kind of results we can easily analyze the devices and select which meets the requirement of the design. In this paper, a way was proposed to simulate SAW devices using VHDL-AMS to get results similar to those measured by network analyzer. This way made it easy to design SAW devices by computer. Only changing some parameters, you can get the results before a SAW device is manufactured. It is also extendible for the system level computer-aided simulation containing SAW. As an example, we used three models of SAW devices to simulate a SAW filter on ST-X quartz. These three models are crossed-field model, modified crossed-field model and network model. The software used in simulation is ADVance MS (mentor graphics). In order to conquer the shortage of the VHDL-AMS, Foster´s reactance theorem was used. The results were compared with the results measured by network analyzer. It shows that the simulation of network model is closer to that of measurement, in which the parameters were calculated by FEM.
Keywords :
circuit analysis computing; circuit simulation; finite element analysis; hardware description languages; network analysers; surface acoustic wave filters; ADVance MS; Foster reactance theorem; SAW device; SAW filter; ST-X quartz; VHDL-AMS; computer-aided simulation; finite element method; modified crossed-field model; network analyzer; network model; surface acoustic wave device; Acoustic measurements; Acoustic waves; Analytical models; Computational modeling; Computer simulation; Instruments; Manufacturing; SAW filters; Surface acoustic wave devices; Surface acoustic waves;
Conference_Titel :
Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
Print_ISBN :
0-7803-8002-9
DOI :
10.1109/ISSE.2003.1260491