• DocumentCode
    2504618
  • Title

    Assessment of design approaches for high-efficiency GaAs solar cells

  • Author

    DeMoulin, P.D. ; Lundstrom, M.S.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    497
  • Abstract
    A comprehensive, two-dimensional numerical simulation program for GaAs-based solar cells is used to project achievable efficiency limits for concentrator cells. With lifetimes characteristic of high-quality GaAs, it is projected that conventional p/n heteroface cells can achieve just over 30% conversion efficiency under 500 AM1.5 direct suns. The n/p cell should achieve just under 30% efficiency. These projections assume no shadowing or reflection losses. Simulations show that bandgap-narrowing effects degrade cell performance, but the effects can be largely overcome in n/p cells by using heterojunction back-surface fields. GaAs cells with lightly doped base regions are also investigated, but simulations show that they offer no substantial performance advantage over more conventional designs and are especially sensitive to surface recombination. The simulations suggest that heteroface cells can achieve efficiencies only a few percentage points below the approximately 35% thermodynamic limit under 50 AM1.5 suns.
  • Keywords
    III-V semiconductors; engineering computing; gallium arsenide; solar cells; 2D numerical simulation program; 30 percent; GaAs solar cells; bandgap-narrowing effects; heterojunction back-surface fields; reflection losses; semiconductor; shadowing losses; surface recombination; Degradation; Gallium arsenide; Heterojunctions; Numerical models; Numerical simulation; Optical reflection; Photonic band gap; Photovoltaic cells; Poisson equations; Radiative recombination; Shadow mapping; Silicon; Sun; Testing; Thermodynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105751
  • Filename
    105751