DocumentCode :
2504835
Title :
Dependence of exchange biasing on the thickness of antiferromagnetic layer
Author :
Ambrose, T. ; Chien, C.L.
Author_Institution :
Johns Hopkins Univ.
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
174
Lastpage :
174
Keywords :
Anisotropic magnetoresistance; Antiferromagnetic materials; Doping; Iron; Magnetic anisotropy; Magnetic resonance; Perpendicular magnetic anisotropy; Spin valves; Temperature dependence; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.742095
Filename :
742095
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2504835
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