DocumentCode
2504835
Title
Dependence of exchange biasing on the thickness of antiferromagnetic layer
Author
Ambrose, T. ; Chien, C.L.
Author_Institution
Johns Hopkins Univ.
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
174
Lastpage
174
Keywords
Anisotropic magnetoresistance; Antiferromagnetic materials; Doping; Iron; Magnetic anisotropy; Magnetic resonance; Perpendicular magnetic anisotropy; Spin valves; Temperature dependence; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.742095
Filename
742095
Link To Document