Title :
Characterization of subcortical structures during deep brain stimulation utilizing support vector machines
Author :
Guillén, P. ; Martínez-de-Pisón, F. ; Sánchez, R. ; Argáez, M. ; Velázquez, L.
Author_Institution :
Univ. of Texas at El Paso, El Paso, TX, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
In this paper we discuss an efficient methodology for the characterization of Microelectrode Recordings (MER) obtained during deep brain stimulation surgery for Parkinson´s disease using Support Vector Machines and present the results of a preliminary study. The methodology is based in two algorithms: (1) an algorithm extracts multiple computational features from the microelectrode neurophysiology, and (2) integrates them in the support vector machines algorithm for classification. It has been applied to the problem of the recognition of subcortical structures: thalamus nucleus, zona incerta, subthalamic nucleus and substantia nigra. The SVM (support vector machines) algorithm performed quite well achieving 99.4% correct classification. In conclusion, the use of a computer-based system, like the one described in this paper, is intended to avoid human subjectivity in the localization of the subcortical structures and mainly the subthalamic nucleus (STN) for neurostimulation.
Keywords :
biomedical electrodes; brain; diseases; medical signal processing; microelectrodes; neurophysiology; support vector machines; Microelectrode Recordings; Parkinson´s disease; deep brain stimulation; microelectrode neurophysiology; subcortical structures; substantia nigra; subthalamic nucleus; support vector machine; thalamus nucleus; zona incerta; Classification algorithms; Educational institutions; Kernel; Microelectrodes; Satellite broadcasting; Support vector machines; Surgery; Cerebral Cortex; Deep Brain Stimulation; Female; Humans; Male; Microelectrodes; Middle Aged; Reproducibility of Results; Support Vector Machines;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091960